Search results for "Gate-level"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
69	Ghassan Al Hayek, Chantal Robach	On the Adequacy of Deriving Hardware Test Data from the Behavioral Specification.	EUROMICRO	1996	DBLP DOI BibTeX RDF	hardware test data, behavioral fault modeling, gate-level strategies, high-level fault detection, gate-level fault detection, design automation tools, generated test set, gate-level fault coverage, hardware description languages, hardware description languages, behavioral specification
59	Lifeng Wu, Jingkun Fang, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu, Nobufusa Iwanishi, Norio Koike, Hirokazu Yonezawa, Yoshiyuki Kawakami	GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design.	ISQED	2000	DBLP DOI BibTeX RDF	Hot Carrier Effect, Gate level modeling, Gate level simulation, Circuit reliability simulation, VLSI
55	Scott Davidson 0001	High level design automation tools (session overview).	ACM Conference on Computer Science	1985	DBLP DOI BibTeX RDF
49	Sheng Wei 0001, Saro Meguerdichian, Miodrag Potkonjak	Gate-level characterization: foundations and hardware security applications.	DAC	2010	DBLP DOI BibTeX RDF	gate-level characterization, hardware Trojan horse, thermal conditioning, manufacturing variability
48	Irith Pomeranz, Sudhakar M. Reddy	Functional test generation for delay faults in combinational circuits.	ICCAD	1995	DBLP DOI BibTeX RDF	gate-level realizations, logic testing, delays, test generation, test generators, combinational circuits, fault simulated, logic CAD, delay faults, functional fault model, functional test generation
47	Man-Lap Li, Pradeep Ramachandran, Ulya R. Karpuzcu, Siva Kumar Sastry Hari, Sarita V. Adve	Accurate microarchitecture-level fault modeling for studying hardware faults.	HPCA	2009	DBLP DOI BibTeX RDF
46	Debapriya Chatterjee, Andrew DeOrio, Valeria Bertacco	Event-driven gate-level simulation with GP-GPUs.	DAC	2009	DBLP DOI BibTeX RDF	gate-level simulation, general purpose graphics processing unit (GP-GPU), high-performance simulation
44	Chris J. Myers, Tomas Rokicki, Teresa H.-Y. Meng	Automatic synthesis of gate-level timed circuits with choice.	ARVLSI	1995	DBLP DOI BibTeX RDF	gate-level timed circuits, C-elements, explicit timing information, textual specification, conditional operation, reachable state space, semi-custom components, timing, logic CAD, asynchronous circuits, asynchronous circuits, circuit CAD, cellular arrays, circuit complexity, logic arrays, graphical representation, standard-cells, CAD tool, automatic synthesis, gate-arrays, state-space methods, AND gates, OR gates
43	Shahrzad Mirkhani, Meisam Lavasani, Zainalabedin Navabi	Hierarchical Fault Simulation Using Behavioral and Gate Level Hardware Models.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
43	Mark Litterick, Joachim Geishauser	Robust Vera Coding Techniques for Gate-Level and Tester-Compliant SoC Verification Environments.	MTV	2004	DBLP DOI BibTeX RDF
41	Mu-Shun Matt Lee, Chin-Hsun Lin, Chien-Nan Jimmy Liu, Shih-Che Lin	Quick supply current waveform estimation at gate level using existed cell library information.	ACM Great Lakes Symposium on VLSI	2008	DBLP DOI BibTeX RDF	current waveform estimation, gate-level
40	Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck	Deterministic test generation for non-classical faults on the gate level.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	deterministic test pattern generator, gate level fault models, function conversions, nonclassical faults, fault list generator, library-based fault modeling strategy, ISCAS benchmark circuits, scan-based circuits, CMOS cell library, algorithm, fault diagnosis, logic testing, design for testability, ATPG, combinational circuits, combinational circuits, fault simulator, logic CAD, stuck-at faults, CMOS logic circuits, bridging faults, deterministic algorithms, logic simulation, transition faults, automatic test software, test efficiency, CONTEST
40	Scott Woods, Giorgio Casinovi	Gate-level simulation of digital circuits using multi-valued Boolean algebras.	ICCAD	1995	DBLP DOI BibTeX RDF	Gate-level logic simulation, mixed-mode simulation, boolean equations solution, multi-valued logic
39	Ashish Srivastava, Kaviraj Chopra, Saumil Shah, Dennis Sylvester, David T. Blaauw	A Novel Approach to Perform Gate-Level Yield Analysis and Optimization Considering Correlated Variations in Power and Performance.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
38	Bao Liu 0001	Gate Level Statistical Simulation Based on Parameterized Models for Process and Signal Variations.	ISQED	2007	DBLP DOI BibTeX RDF
37	Alexander Maili, Damian Dalton, Christian Steger	A Generic Timing Mechanism for Using the APPLES Gate-Level Simulator in a Mixed-Level Simulation Environment.	PATMOS	2004	DBLP DOI BibTeX RDF
36	Srivaths Ravi 0001, Niraj K. Jha, Indradeep Ghosh, Vamsi Boppana	A Technique for Identifying RTL and Gate-Level Correspondences.	ICCD	2000	DBLP DOI BibTeX RDF
35	Foong-Charn Chang, Chin-Fu Chen, Prasad Subramaniam	An Accurate and Efficient Gate Level Delay Calculator for MOS Circuits.	DAC	1988	DBLP BibTeX RDF
35	Teruhiko Yamada, Koji Yamazaki, Edward J. McCluskey	A simple technique for locating gate-level faults in combinational circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	electron probe analysis, optical microscopy, gate-level faults, error sources, fault deduction, fault elimination, ISCAS'85 benchmark circuits, physical defect analysis, electron beam probing, light emission microscopy, computational complexity, VLSI, VLSI, fault diagnosis, logic testing, integrated circuit testing, combinational circuits, combinational circuits, digital simulation, circuit analysis computing, computation time, scanning electron microscopy, scanning electron microscopy, diagnostic resolution
33	Venkataraman Mahalingam, N. Ranganathan	A Nonlinear Programming Based Power Optimization Methodology for Gate Sizing and Voltage Selection.	ISVLSI	2005	DBLP DOI BibTeX RDF
32	Loganathan Lingappan, Srivaths Ravi 0001, Niraj K. Jha	Satisfiability-based test generation for nonseparable RTL controller-datapath circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
31	Fabrizio Ferrandi, Franco Fummi, Donatella Sciuto	Test Generation and Testability Alternatives Exploration of Critical Algorithms for Embedded Applications.	IEEE Trans. Computers	2002	DBLP DOI BibTeX RDF	Testing of embedded systems, VHDL, ATPG, fault modeling, testability analysis
31	Irith Pomeranz, Sudhakar M. Reddy	Functional test generation for delay faults in combinational circuits.	ACM Trans. Design Autom. Electr. Syst.	1998	DBLP DOI BibTeX RDF	function-robust tests, functional delay fault model, delay faults, path delay faults, robust tests
31	MyeongGyu Jeong, Toru Nakura, Makoto Ikeda, Kunihiro Asada	Moebius circuit: dual-rail dynamic logic for logic gate level pipeline with error gate search feature.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	dcvsl, high speed digital, pipeline, error detect, soft error
31	Chetana Nagendra, Robert Michael Owens, Mary Jane Irwin	Design tradeoffs in high speed multipliers and FIR filters.	VLSI Design	1996	DBLP DOI BibTeX RDF	high speed multipliers, high speed FIR filters, modified Booth recoding, pipeline granularity, transistor count, activity factor reduction, guarded evaluation, gate-level pipelining, half-bit level pipelining, bit-level pipelining, delay, clocking, digital filters, FIR filters, multiplying circuits, power dissipation, design tradeoffs, pipeline arithmetic, operation speed
31	Michael S. Hsiao, Janak H. Patel	A new architectural-level fault simulation using propagation prediction of grouped fault-effects.	ICCD	1995	DBLP DOI BibTeX RDF	architectural-level fault simulation, propagation prediction, grouped fault-effects, fault effects, intelligent propagation prediction, automated behavioral simulation, ALFSIM, Architectural Level Fault Simulation, gate level fault simulation, VLSI, fault diagnosis, circuit analysis computing, stuck at faults, integrated circuit design, deterministic algorithm, data types, symbolic data, architectural level
31	B. P. Harish, Navakanta Bhat, Mahesh B. Patil	On a Generalized Framework for Modeling the Effects of Process Variations on Circuit Delay Performance Using Response Surface Methodology.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2007	DBLP DOI BibTeX RDF
31	Jayashree Sridharan, Tom Chen 0001	Modeling multiple input switching of CMOS gates in DSM technology using HDMR.	DATE	2006	DBLP DOI BibTeX RDF
31	Ashok K. Murugavel, N. Ranganathan	Gate Sizing and Buffer Insertion using Economic Models for Power Optimization.	VLSI Design	2004	DBLP DOI BibTeX RDF
30	Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud	A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.	VTS	2006	DBLP DOI BibTeX RDF
30	Raimund Ubar, Jaan Raik, Eero Ivask, Marina Brik	Multi-Level Fault Simulation of Digital Systems on Decision Diagrams.	DELTA	2002	DBLP DOI BibTeX RDF	register transfer and gate level descriptions, fault simulation, decision diagrams, Digital systems
30	Indradeep Ghosh, Anand Raghunathan, Niraj K. Jha	Design for hierarchical testability of RTL circuits obtained by behavioral synthesis.	ICCD	1995	DBLP DOI BibTeX RDF	design for hierarchical testability, gate-level sequential test generation, controller data path circuits, large data path bit-widths, minimal test hardware, system-level test set, logic testing, high level synthesis, high level synthesis, integrated circuit testing, design for testability, design for testability, automatic testing, logic CAD, integrated circuit design, behavioral synthesis, logic gates, register-transfer level design, RTL circuits
30	Chingwei Yeh, Yin-Shuin Kang	Cell-based layout techniques supporting gate-level voltage scaling for low power.	IEEE Trans. Very Large Scale Integr. Syst.	2001	DBLP DOI BibTeX RDF
30	Chingwei Yeh, Yin-Shuin Kang	Cell-based layout techniques supporting gate-level voltage scaling for low power.	IEEE Trans. Very Large Scale Integr. Syst.	2000	DBLP DOI BibTeX RDF
29	Miodrag Potkonjak, Ani Nahapetian, Michael Nelson 0002, Tammara Massey	Hardware Trojan horse detection using gate-level characterization.	DAC	2009	DBLP DOI BibTeX RDF	Hardware Trojan horses, gate-level characterization, linear programming, manufacturing variability
29	Saeeid Tahmasbi Oskuii, Per Gunnar Kjeldsberg, Einar J. Aas	Probabilistic gate-level power estimation using a novel waveform set method.	ACM Great Lakes Symposium on VLSI	2007	DBLP DOI BibTeX RDF	probabilistic power estimation, probability waveform, transition density, combinational logic, gate-level
29	Chunhong Chen, Majid Sarrafzadeh	An Effective Algorithm for Gate-Level Power-Delay Tradeoff Using Two Voltages.	ICCD	1999	DBLP DOI BibTeX RDF	Two-voltage, Algorithm, Low power, Gate-level
29	Oriol Roig, Jordi Cortadella, Enric Pastor	Hierarchical gate-level verification of speed-independent circuits.	ASYNC	1995	DBLP DOI BibTeX RDF	hierarchical gate-level verification, state signals, computational complexity, logic testing, time complexity, asynchronous circuits, speed-independent circuits, complex gates
29	Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda	Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques.	DATE	1998	DBLP DOI BibTeX RDF	software testing, sequential circuits, automatic test generation, test sequence compaction
29	Loganathan Lingappan, Srivaths Ravi 0001, Niraj K. Jha	Test Generation for Non-separable RTL Controller-datapath Circuits using a Satisfiability based Approach.	ICCD	2003	DBLP DOI BibTeX RDF
29	Ruofan Xu, Michael S. Hsiao	Embedded core testing using genetic algorithms.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	gate level implementation, user defined logic, random inputs, high level benchmarks, wrapper size, genetic algorithms, genetic algorithms, fault diagnosis, logic testing, controllability, controllability, high level synthesis, automatic test pattern generation, observability, observability, application specific integrated circuits, fault coverage, SOC, test application time, test patterns, embedded core testing, internal state
29	Mitrajit Chatterjee, Dhiraj K. Pradhan, Wolfgang Kunz	LOT: logic optimization with testability-new transformations using recursive learning.	ICCAD	1995	DBLP DOI BibTeX RDF	EX-OR gates, logic optimization with testability, multi-level logic circuits, tstfx, logic design, combinational circuits, logic CAD, gate level, random-pattern testability, recursive learning
29	Alexander Maili, Christian Steger, Reinhold Weiss, Rob Quigley, Damian Dalton	Reducing the Communication Bottleneck via On-Chip Cosimulation of Gate-Level HDL and C-Models on a Hardware Accelerator.	ISVLSI	2005	DBLP DOI BibTeX RDF
29	Ying-Tsai Chang, Kwang-Ting Cheng	Self-referential verification for gate-level implementations of arithmetic circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
28	Anand Raghunathan, Sujit Dey, Niraj K. Jha	Register-transfer level estimation techniques for switching activity and power consumption.	ICCAD	1996	DBLP DOI BibTeX RDF	gate-level implementation, register-transfer level estimation, logic design, power consumption, switching activity, glitching, RTL designs
28	Zbysek Gajda, Lukás Sekanina	Reducing the number of transistors in digital circuits using gate-level evolutionary design.	GECCO	2007	DBLP DOI BibTeX RDF	digital circuits, evolvable hardware, evolutionary design
28	Lukás Sekanina, Zdenek Vasícek	On the Practical Limits of the Evolutionary Digital Filter Design at the Gate Level.	EvoWorkshops	2006	DBLP DOI BibTeX RDF
28	Bernard N. Sheehan	Library Compatible Ceff for Gate-Level Timing.	DATE	2002	DBLP DOI BibTeX RDF
28	Ying-Tsai Chang, Kwang-Ting Cheng	Self-referential verification of gate-level implementations of arithmetic circuits.	DAC	2002	DBLP DOI BibTeX RDF	arithmetic circuit verification
28	Chris J. Myers, Tomas Rokicki, Teresa H.-Y. Meng	POSET timing and its application to the synthesis and verification of gate-level timed circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1999	DBLP DOI BibTeX RDF
27	Jayashree Sridharan, Tom Chen 0001	Gate Delay Modeling with Multiple Input Switching for Static (Statistical) Timing Analysis.	VLSI Design	2006	DBLP DOI BibTeX RDF
27	Sandip Kundu	GateMaker: a transistor to gate level model extractor for simulation, automatic test pattern generation and verification.	ITC	1998	DBLP DOI BibTeX RDF
27	Tatjana Serdar, Carl Sechen	AKORD: transistor level and mixed transistor/gate level placement tool for digital data paths.	ICCAD	1999	DBLP DOI BibTeX RDF
27	Mohit Tiwari, Xun Li 0001, Hassan M. G. Wassel, Frederic T. Chong, Timothy Sherwood	Execution leases: a hardware-supported mechanism for enforcing strong non-interference.	MICRO	2009	DBLP DOI BibTeX RDF	gate level information flow tracking, covert channels, high assurance systems, timing channels
26	Supratik Chakraborty, Rajeev Murgai	Complexity Of Minimum-Delay Gate Resizing.	VLSI Design	2001	DBLP DOI BibTeX RDF
26	Susmita Sur-Kolay, Marly Roncken, Ken S. Stevens, Parimal Pal Chaudhuri, Rob Roy	Fsimac: a fault simulator for asynchronous sequential circuits.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	Fsimac, gate-level fault simulator, Muller C-elements, complex domino gates, high-speed design, min-max timing analysis, min-max rime stamps, CA-BIST, waveform model, logic testing, built-in self test, timing, cellular automata, Cellular Automata, sequential circuits, iterative methods, fault simulation, fault simulator, asynchronous circuits, stuck-at faults, iterations, delay faults, combinational logic, feedback loops, pseudo-random tests, gate-delay faults, asynchronous sequential circuits
26	Brian Grayson, Saghir A. Shaikh, Stephen A. Szygenda	Statistics on concurrent fault and design error simulation.	ICCD	1995	DBLP DOI BibTeX RDF	concurrent fault/design error simulation, design error simulation processes, c-sim, gate level concurrent simulator, event based statistics, gate evaluation statistics, simulator developers, hardware accelerator designers, design options, parallel algorithms, formal verification, circuit analysis computing, design verification, memory requirements, experimental data, concurrent simulators
26	Enric Pastor, Jordi Cortadella, Oriol Roig	A new look at the conditions for the synthesis of speed-independent circuits.	Great Lakes Symposium on VLSI	1995	DBLP DOI BibTeX RDF	gate-level synthesis, gate library constraint, fan-in reduction, VLSI, logic design, logic CAD, integrated circuit design, circuit CAD, integrated logic circuits, circuit optimisation, optimization techniques, speed-independent circuits
26	Ali Reza Ejlali, Seyed Ghassem Miremadi	Switch-level emulation.	DAC	2003	DBLP DOI BibTeX RDF	FPGA chips, gate-level models, emulation, switch-level models
26	C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal	A STAFAN-like functional testability measure for register-level circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	functional testability measure, register-level circuits, testability analysis programs, SCOAP, gate-level digital circuits, testability-driven synthesis, busses, F-STAFAN, Sun/SPARC workstation, performance evaluation, fault diagnosis, logic testing, high-level synthesis, statistical analysis, design for testability, fault simulation, fault coverage, circuit analysis computing, adders, multipliers, multiplexers, digital circuit, shift registers, logic gates, reliability theory, stuck-at fault model
25	Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli	Improving Gate-Level ATPG by Traversing Concurrent EFSMs.	VTS	2006	DBLP DOI BibTeX RDF
25	Fei Li 0003, Lei He 0001, Joseph M. Basile, Rakesh J. Patel, Hema Ramamurthy	High-level area and power-up current estimation considering rich cell library.	ASP-DAC	2004	DBLP DOI BibTeX RDF
25	Sumit Ghosh, Tapan J. Chakraborty	On behavior fault modeling for digital designs.	J. Electron. Test.	1991	DBLP DOI BibTeX RDF	fault coverage correlation, fault model, fault simulation, stuck-at fault, behavior model
25	Letícia Maria Veiras Bolzani, Edgar E. Sánchez, Matteo Sonza Reorda	A software-based methodology for the generation of peripheral test sets based on high-level descriptions.	SBCCI	2007	DBLP DOI BibTeX RDF	RT-level test metrics, code coverage metrics, gate-level test metrics, test block, fault coverage, SoC testing
24	Eyad Alkassar, Peter Böhm, Steffen Knapp	Formal Correctness of an Automotive Bus Controller Implementation at Gate-Level.	DIPES	2008	DBLP DOI BibTeX RDF
24	Michael Boehner	LOGEX - an Automatic Logic Extractor Form Transistor to Gate Level for CMOS Technology.	DAC	1988	DBLP BibTeX RDF
24	Sriram Sambamurthy, Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham	Functionally valid gate-level peak power estimation for processors.	ISQED	2009	DBLP DOI BibTeX RDF
24	Srivaths Ravi 0001, Indradeep Ghosh, Vamsi Boppana, Niraj K. Jha	Fault-diagnosis-based technique for establishing RTL and gate-levelcorrespondences.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2001	DBLP DOI BibTeX RDF
24	Seyed Ghassem Miremadi, Ali Reza Ejlali	Switch Level Fault Emulation.	FPL	2003	DBLP DOI BibTeX RDF
23	Mark A. Hillebrand, Sergey Tverdyshev	Formal Verification of Gate-Level Computer Systems.	CSR	2009	DBLP DOI BibTeX RDF
23	Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong Yang, Yuan Xie 0001	A Novel Gate-Level NBTI Delay Degradation Model with Stacking Effect.	PATMOS	2007	DBLP DOI BibTeX RDF
23	Justin Lee, Joaquin Sitte	Gate-level Morphogenetic Evolvable Hardware for Scalability and Adaptation on FPGAs.	AHS	2006	DBLP DOI BibTeX RDF
23	Qi Wang, Sumit Roy 0003	RTL Power Optimization with Gate-Level Accuracy.	ICCAD	2003	DBLP DOI BibTeX RDF
23	J. W. Smith	The gsim gate-level simulator.	ACM Southeast Regional Conference	2000	DBLP DOI BibTeX RDF
23	Alessandro Bogliolo, Luca Benini, Giovanni De Micheli, Bruno Riccò	Gate-level power and current simulation of CMOS integrated circuits.	IEEE Trans. Very Large Scale Integr. Syst.	1997	DBLP DOI BibTeX RDF
23	Kwang-Ting Cheng	Gate-level test generation for sequential circuits.	ACM Trans. Design Autom. Electr. Syst.	1996	DBLP DOI BibTeX RDF	testing, automatic test generation, IC testing, sequential circuit test generation
23	Andres R. Takach, Niraj K. Jha	Easily testable gate-level and DCVS multipliers.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1991	DBLP DOI BibTeX RDF
23	Nasir Mohyuddin, Ehsan Pakbaznia, Massoud Pedram	Probabilistic error propagation in logic circuits using the Boolean difference calculus.	ICCD	2008	DBLP DOI BibTeX RDF
23	Zuying Luo	General transistor-level methodology on VLSI low-power design.	ACM Great Lakes Symposium on VLSI	2006	DBLP DOI BibTeX RDF	nanometer, transistor level, simulation, optimization
23	Pradip A. Thaker, Vishwani D. Agrawal, Mona E. Zaghloul	A test evaluation technique for VLSI circuits using register-transfer level fault modeling.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2003	DBLP DOI BibTeX RDF
23	Fabrizio Ferrandi, G. Fornara, Donatella Sciuto, G. Ferrara, Franco Fummi	Testability Alternatives Exploration through Functional Testing.	VTS	2000	DBLP DOI BibTeX RDF	High-level Testability Analysis, Behavioral Test Generation, VHDL, ATPG
23	Manish Pandey, Alok Jain, Randal E. Bryant, Derek L. Beatty, Gary York, Samir Jain	Extraction of finite state machines from transistor netlists by symbolic simulation.	ICCD	1995	DBLP DOI BibTeX RDF	finite state machine extraction, transistor netlists, clock level finite state machines, gate level representation, circuit clocking, output timing, simulation patterns, next state, output function, equivalent FSM, static storage structures, time multiplexed inputs, time multiplexed outputs, finite state machines, logic design, logic CAD, circuit analysis computing, FSMs, symbolic simulation, symbolic simulator, Ordered Binary Decision Diagrams
23	Shiu-Kai Chin, John Faust, Joseph Giordano	Integrating formal methods tools to support system design.	ICECCS	1995	DBLP DOI BibTeX RDF	formal methods tools integration, top-level process descriptions, gate-level hardware designs, simulators, formal specification, system design, specification languages, specification languages, systems analysis, system engineering, theorem-provers, computer-aided design tools, model checkers
23	Vivek Chickermane, Jaushin Lee, Janak H. Patel	Addressing design for testability at the architectural level.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
22	Sergey Tverdyshev	A verified platform for a gate-level electronic control unit.	FMCAD	2009	DBLP DOI BibTeX RDF
22	Frank Sill, Frank Grassert, Dirk Timmermann	Low power gate-level design with mixed-Vth (MVT) techniques.	SBCCI	2004	DBLP DOI BibTeX RDF	MVT, leakage currents, threshold voltage
22	Aditya Bansal, Jae-Joon Kim, Keunwoo Kim, Saibal Mukhopadhyay, Ching-Te Chuang, Kaushik Roy 0001	Optimal Dual-VT Design in Sub-100 Nanometer PDSOI and Double-Gate Technologies.	VLSI Design	2008	DBLP DOI BibTeX RDF
22	Quming Zhou, Kartik Mohanram	Gate sizing to radiation harden combinational logic.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
22	Tae Il Bae, Jin Wook Kim, Young Hwan Kim	New Gate Models for Gate-Level Delay Calculation under Crosstalk Effects.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2008	DBLP DOI BibTeX RDF
22	Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud	Extending gate-level diagnosis tools to CMOS intra-gate faults.	IET Comput. Digit. Tech.	2007	DBLP DOI BibTeX RDF
22	Mohit Tiwari, Hassan M. G. Wassel, Bita Mazloom, Shashidhar Mysore, Frederic T. Chong, Timothy Sherwood	Complete information flow tracking from the gates up.	ASPLOS	2009	DBLP DOI BibTeX RDF	provably sound, gate level, information flow tracking
22	Xin Wang, Alireza Kasnavi, Harold Levy	An Efficient Method for Fast Delay and SI Calculation Using Current Source Models.	ISQED	2008	DBLP DOI BibTeX RDF	Delay calculation, gate-level analysis, transient simulation, SI
22	Zhimin Chen, Yujie Zhou	Dual-Rail Random Switching Logic: A Countermeasure to Reduce Side Channel Leakage.	CHES	2006	DBLP DOI BibTeX RDF	Gate Level Masking, DRSL, Dual-Rail, Pre-charge, Side Channel Attacks, DPA
22	Kyu-won Choi, Abhijit Chatterjee	HA2TSD: hierarchical time slack distribution for ultra-low power CMOS VLSI.	ISLPED	2002	DBLP DOI BibTeX RDF	gate-level power optimization, time slack distribution, low-power design
22	Takeshi Sakamoto, Takashi Yamada, Mamoru Mukuno, Yoshifumi Matsushita, Yasoo Harada, Hiroto Yasuura	Power analysis techniques for SoC with improved wiring models.	ISLPED	2002	DBLP DOI BibTeX RDF	custom wire load model, SoC, power analysis, gate-level
22	Irith Pomeranz, Sudhakar M. Reddy	On the feasibility of fault simulation using partial circuit descriptions.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	partial circuit description, gate-level circuits, subcircuits, logic testing, fault simulation, fault simulation, memory requirements
22	Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero, Massimo Violante	A genetic algorithm-based system for generating test programs for microprocessor IP cores.	ICTAI	2000	DBLP DOI BibTeX RDF	industrial property, genetic algorithm based system, test program generation, microprocessor IP cores, digital systems design trend, design-and-reuse paradigm, intellectual property cores, encrypted gate-level netlist, testability problems, automatic approach, processor cores, fault coverage figures, random approach, genetic algorithms, genetic algorithms, microprocessor chips, automatic test software, test program, electronic engineering computing
22	Kazumi Hatayama, Kazunori Hikone, Takeshi Miyazaki, Hiromichi Yamada	A practical approach to instruction-based test generation for functional modules of VLSI processors.	VTS	1997	DBLP DOI BibTeX RDF	VLSI processors, instruction-based test generation, functional test pattern generation, gate level faults, constrained test generation, ALU oriented test pattern generation system, VLSI, functional modules, ALPS
22	Jitendra Khare, Wojciech Maly, Nathan Tiday	Fault characterization of standard cell libraries using inductive contamination.	VTS	1996	DBLP DOI BibTeX RDF	surface contamination, fault characterization, standard cell libraries, inductive contamination analysis, contamination diagnosis, gate-level delay characterization, fault diagnosis, test generation, integrated circuit testing, cellular arrays, defect coverage
22	Franco Fummi, Donatella Sciuto, M. Serro	Synthesis for testability of large complexity controllers.	ICCD	1995	DBLP DOI BibTeX RDF	large complexity controllers, industrial design environments, top-down methodology, hierarchical descriptions, irredundant circuits, optimized gate-level descriptions, testable descriptions, specification, high level synthesis, finite state machines, finite state machines, design for testability, design for testability, VHDL, automatic testing, logic CAD, hardware description languages, FSM, synthesis for testability, logic gates