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Searching for MLV with no syntactic query expansion in all metadata.

Publication years (Num. hits)
2004-2021 (8)
Publication types (Num. hits)
article(3) inproceedings(5)
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Results
Found 8 publication records. Showing 8 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
113Lin Yuan, Gang Qu 0001 Enhanced leakage reduction Technique by gate replacement. Search on Bibsonomy DAC The full citation details ... 2005 DBLP  DOI  BibTeX  RDF MLV, gate replacement, leakage reduction
112Tsung-Yi Wu, Jr-Luen Tzeng, Kuang-Yao Chen A Fast Probability-Based Algorithm for Leakage Current Reduction Considering Controller Cost. Search on Bibsonomy ASP-DAC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF MLV controller, probability-based algorithm, leakage current reduction, minimum leakage vector
106Lin Yuan, Gang Qu 0001 A combined gate replacement and input vector control approach for leakage current reduction. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
39Zhen Wan, Rustam Ismatov, Haiyan Xu 0001 Efficiency of Competitiveness Evaluation of Medium-Lift Launch Vehicle (MLV) Using Integrated DEA-TOPSIS Model. Search on Bibsonomy INSID The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
39Carlos Manuel Oliveira Alves, Manuel Pérez Cota, Miguel Ramón González Castro Multi-Level Visualization with the MLV-Viewer Prototype. Search on Bibsonomy IntelliSys (2) The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
39Ze Chen 0006, Jun Bi, Yonghong Fu, Yangyang Wang 0001, Anmin Xu MLV: A Multi-dimension Routing Information Exchange Mechanism for Inter-domain SDN. Search on Bibsonomy ICNP The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
39M. H. Ji, C.-H. Choi, B. K. Jang, B. K. Kim Study on electrostatic discharge (ESD) reliability improvement of ZnO-based multilayered chip varistor(MLV). Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
26Wei Wang, Yu Hu 0001, Yinhe Han 0001, Xiaowei Li 0001, You-Sheng Zhang Leakage Current Optimization Techniques During Test Based on Don't Care Bits Assignment. Search on Bibsonomy J. Comput. Sci. Technol. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF don’t care bits, minimum leakage vector, leakage power, leakage current
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