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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 6 occurrences of 6 keywords
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Results
Found 6 publication records. Showing 6 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 159 | Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier |
Enhanced Reduced Pin-Count Test for Full-Scan Design.  |
J. Electron. Test.  |
2002 |
DBLP DOI BibTeX RDF |
reduced pin-count test, core test, design for testability, ATE, boundary-scan test, scan test |
| 79 | Jay Jahangiri, Nilanjan Mukherjee 0001, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press |
Achieving High Test Quality with Reduced Pin Count Testing. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
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| 63 | A. Dehghani, F. Shabani, Patricia Nava |
Off-Line Recognition of Isolated Persian Handwritten Characters Using Multiple Hidden Markov Models. |
ITCC |
2001 |
DBLP DOI BibTeX RDF |
RPCT, CME, HMM, OCR |
| 42 | Prakash Srinivasan, Ronan Farrell |
Hierarchical DFT with Combinational Scan Compression, Partition Chain and RPCT. |
ISVLSI |
2010 |
DBLP DOI BibTeX RDF |
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| 42 | Yuan Yan Tang, Ching Y. Suen |
RPCT Algorithm and its VLSI Implementation. |
IEEE Trans. Syst. Man Cybern. Syst. |
1994 |
DBLP DOI BibTeX RDF |
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| 26 | Sandeep Kumar Goel, Erik Jan Marinissen |
On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips. |
DATE |
2005 |
DBLP DOI BibTeX RDF |
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