Search results for "Syndrome-testing"

Searching for phrase Syndrome-testing (changed automatically) with no syntactic query expansion in all metadata.

Found 6 publication records. Showing 6 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
139	Shiyi Xu	High-Order Syndrome Testing for VLSI Circuits.	PRDC	2005	DBLP DOI BibTeX RDF	Syndrome Testing Minterms, Syndrome, Exhaustive Testing
69	Sunil R. Das, Nishith Goel, Wen-Ben Jone, Amiya R. Nayak	Syndrome signature in output compaction for VLSI BIST.	VLSI Design	1996	DBLP DOI BibTeX RDF	syndrome signature, output compaction, VLSI BIST, input patterns, n-input combinational circuit, primary syndrome, subsyndromes, subfunctions, single-output circuit, multiple output, VLSI, logic testing, data compression, built-in self test, integrated circuit testing, combinational circuits, switching functions, exhaustive testing
30	Jacob Savir	Syndrome-Testing of "Syndrome-Untestable" Combinational Circuits.	IEEE Trans. Computers	1981	DBLP DOI BibTeX RDF	Inversion parity, reconvergent fan-out, unate function
28	Krishnendu Chakrabarty, John P. Hayes	Balance testing and balance-testable design of logic circuits.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	built-in self testing, design for testability, fault detection, fault coverage, testing methods
22	Zeev Barzilai, Jacob Savir, George Markowsky, Merlin G. Smith	The Weighted Syndrome Sums Approach to VLSI Testing.	IEEE Trans. Computers	1981	DBLP DOI BibTeX RDF	Syndrome-testing, syndrome-testable design, Partitioning, self-testing
21	Patrick Kam Lui, Jon C. Muzio	Constrained parity testing.	J. Electron. Test.	1991	DBLP DOI BibTeX RDF	compaction testing, parity testing, Built-in self-test, signature analysis

Displaying result #1 - #6 of 6 (100 per page; Change: )

Maintained by L3S.

Previously maintained by Jörg Diederich.

Based upon DBLP by Michael Ley.

data released under the ODC-BY 1.0 license