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Searching for phrase TP-4 (changed automatically) with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1995 (1)
Publication types (Num. hits)
inproceedings(1)
Venues (Conferences, Journals, ...)
Asian Test Symposium(1)
Authors
Hiroshi Takahashi(1) Nobuhiro Yanagida(1) Yuzo Takamatsu(1)
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Found 1 publication records. Showing 1 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
1Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 1995 DBLP  DOI  BibTeX  RDF electron beam testing, multiple fault diagnosis, sensitized paths, EB testing, TP-1, TP-2, TP-3, TP-4, electron-beam tester, internal lines, VLSI, fault diagnosis, logic testing, combinational circuits, combinational circuits, fault location, fault location, stuck-at faults, diagnostic resolution
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