Search results for "compactor"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
140	Xiao-Feng Li, Ligang Wang 0001, Chen Yang	A Fully Parallel LISP2 Compactor with Preservation of the Sliding Properties.	LCPC	2008	DBLP DOI BibTeX RDF	compactor, parallelization, Garbage collector
120	Reshma C. Jumani, Niraj Bharatkumar Jain, Virendra Singh, Kewal K. Saluja	DX-compactor: distributed X-compaction for SoCs.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	dx-compactor, hierarchical compactor, x-compactor, SoC, compaction
117	Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng	ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values.	ICCD	2005	DBLP DOI BibTeX RDF
100	George Entenman, Stephen W. Daniel	A fully automatic hierarchical compactor.	DAC	1985	DBLP DOI BibTeX RDF
88	Yinhe Han 0001, Xiaowei Li 0001, Huawei Li 0001, Anshuman Chandra	Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction.	J. Comput. Sci. Technol.	2005	DBLP DOI BibTeX RDF	test resource partitioning (TRP), error cancellation, System-on-a-Chip (SoC), diagnose, response compaction
85	Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee 0001, Mark Kassab	X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
85	David Marple, Michiel Smulders, Henk Hegen	An Efficient Compactor for 45° Layout.	DAC	1988	DBLP BibTeX RDF
73	Emil Gizdarski	Constructing Augmented Multimode Compactors.	VTS	2008	DBLP DOI BibTeX RDF	on-chip compression, array codes, linear codes, test data compression
70	Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai	X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis.	IEEE Des. Test Comput.	2007	DBLP DOI BibTeX RDF	on-chip collection of test data, selective compaction of test responses, fault diagnosis, DFT, embedded test, scan-based designs
70	David Marple	A Hierarchy Preserving Hierarchical Compactor.	DAC	1990	DBLP DOI BibTeX RDF
58	Tomoharu Ugawa, Masahiro Yasugi, Taiichi Yuasa	Replication-Based Incremental Compaction.	ISORC	2008	DBLP DOI BibTeX RDF	embedded system, compaction, real-time garbage collection
58	Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel	Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	Space compaction, testing, stuck-at faults, system-on-a-chip
58	Yinhe Han 0001, Yongjun Xu, Huawei Li 0001, Xiaowei Li 0001, Anshuman Chandra	Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Teste.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
58	Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty	Synthesis of single-output space compactors for scan-based sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2002	DBLP DOI BibTeX RDF
58	Andrej A. Morosov, Michael Gössel, Krishnendu Chakrabarty, Bhargab B. Bhattacharya	Design of Parameterizable Error-Propagating Space Compactors for Response Observation.	VTS	2001	DBLP DOI BibTeX RDF
56	Wojciech Rajski, Janusz Rajski	Modular Compactor of Test Responses.	VTS	2006	DBLP DOI BibTeX RDF
56	Ondrej Novák, Zdenek Plíva, Jiri Nosek, Andrzej Hlawiczka, Tomasz Garbolino, Krzysztof Gucwa	Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	test-per-clock testing, test pattern compression, zero aliasing error, built-in self test, test response compaction
56	Michael Gössel, Andrej A. Morosov, Egor S. Sogomonyan	A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces.	VTS	1999	DBLP DOI BibTeX RDF
56	Jin-Fuw Lee, Chak-Kuen Wong	A performance-aimed cell compactor with automatic jogs.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1992	DBLP DOI BibTeX RDF
55	Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu	VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG.	IEEE Des. Test Comput.	2008	DBLP DOI BibTeX RDF	combinational broadcaster, combinational compactor, fault diagnosis, ATPG, test compression, low-power testing, scan testing
44	Haim Kermany, Erez Petrank	The Compressor: concurrent, incremental, and parallel compaction.	PLDI	2006	DBLP DOI BibTeX RDF	garbage collection, memory management, compaction, runtime systems, concurrent garbage collection
44	Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei	Unknown-tolerance analysis and test-quality control for test response compaction using space compactors.	DAC	2006	DBLP DOI BibTeX RDF	design for test, test response compaction
44	Janusz Rajski, Jerzy Tyszer, Chen Wang 0014, Sudhakar M. Reddy	Convolutional Compaction of Test Responses.	ITC	2003	DBLP DOI BibTeX RDF
44	Markus Seuring, Krishnendu Chakrabarty	Space Compaction of Test Responses for IP Cores Using Orthogonal Transmission Functions.	VTS	2000	DBLP DOI BibTeX RDF	non-modeled faults, one-step compaction, two-step compaction, error detection, transparency, Aliasing
44	Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel	Zero-Aliasing Space Compression using a Single Periodic Output and its Application to Testing of Embedded Cores.	VLSI Design	2000	DBLP DOI BibTeX RDF
41	Sverre Wichlund, Frank Berntsen, Einar J. Aas	Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor.	DFT	2006	DBLP DOI BibTeX RDF
41	Peter Wohl, John A. Waicukauski, Sanjay Patel, Cy Hay, Emil Gizdarski, Ben Mathew	Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST.	VTS	2005	DBLP DOI BibTeX RDF
41	Tomás Pérez Segovia, Anne-Françoise Joanblanq	CACTUS: a symbolic CMOS two-dimensional compactor.	EURO-DAC	1990	DBLP DOI BibTeX RDF
41	Sching L. Lin, Jonathan Allen	Minplex - a compactor that minimizes the bounding rectangle and individual rectangles in a layout.	DAC	1986	DBLP DOI BibTeX RDF
29	Tomoharu Ugawa, Hideya Iwasaki, Taiichi Yuasa	Improved replication-based incremental garbage collection for embedded systems.	ISMM	2010	DBLP DOI BibTeX RDF	embedded systems, garbage collection, fragmentation, compaction, real-time garbage collection
29	Shibaji Banerjee, Dipanwita Roy Chowdhury, Bhargab B. Bhattacharya	An Efficient Scan Tree Design for Compact Test Pattern Set.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2007	DBLP DOI BibTeX RDF
29	Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei	A hybrid scheme for compacting test responses with unknown values.	ICCAD	2007	DBLP DOI BibTeX RDF
29	Yinhe Han 0001, Huawei Li 0001, Xiaowei Li 0001, Anshuman Chandra	Response compaction for system-on-a-chip based on advanced convolutional codes.	Sci. China Ser. F Inf. Sci.	2006	DBLP DOI BibTeX RDF	X bits masking, aliasing, convolutional code, SOC test, response compaction
29	Artur Pogiel, Janusz Rajski, Jerzy Tyszer	Convolutional Compactors with Variable Polynomials.	ETS	2006	DBLP DOI BibTeX RDF
29	Erik H. Volkerink, Subhasish Mitra	Response compaction with any number of unknowns using a new LFSR architecture.	DAC	2005	DBLP DOI BibTeX RDF	LFS, x-compact, compression, BIST, VLSI test
29	Josep Díaz, Maria J. Serna, Dimitrios M. Thilikos	Fixed Parameter Algorithms for Counting and Deciding Bounded Restrictive List H-Colorings.	ESA	2004	DBLP DOI BibTeX RDF
29	Janak H. Patel, Steven S. Lumetta, Sudhakar M. Reddy	Application of Saluja-Karpovsky Compactors to Test Responses with Many Unknowns.	VTS	2003	DBLP DOI BibTeX RDF
29	Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty	Robust Space Compaction of Test Responses.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
29	Krishnendu Chakrabarty, John P. Hayes	Zero-aliasing space compaction of test responses using multiple parity signatures.	IEEE Trans. Very Large Scale Integr. Syst.	1998	DBLP DOI BibTeX RDF
29	Krishnendu Chakrabarty	Zero-aliasing space compaction using linear compactors with bounded overhead.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1998	DBLP DOI BibTeX RDF
29	D. Lambidonis, André Ivanov, Vinod K. Agarwal	Fast signature computation for BIST linear compactors.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1995	DBLP DOI BibTeX RDF
29	Slawomir Pilarski, Tiko Kameda, André Ivanov	Sequential faults and aliasing.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1993	DBLP DOI BibTeX RDF
26	Md. Touhidul Islam, Syed Masum Billah	SpaceX Mag: An Automatic, Scalable, and Rapid Space Compactor for Optimizing Smartphone App Interfaces for Low-Vision Users.	Proc. ACM Interact. Mob. Wearable Ubiquitous Technol.	2023	DBLP DOI BibTeX RDF
26	Anahita Banaei, Shadrokh Samavi, Ebrahim Nasr-Esfahani	Lossless Microarray Image Compression by Hardware Array Compactor.	CoRR	2023	DBLP DOI BibTeX RDF
26	Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak	X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan.	IEEE Trans. Very Large Scale Integr. Syst.	2021	DBLP DOI BibTeX RDF
26	Marcel Merten, Sebastian Huhn 0001, Rolf Drechsler	A Codeword-based Compactor for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks.	DFT	2021	DBLP DOI BibTeX RDF
26	Polidor Bratu	Multibody System with Elastic Connections for Dynamic Modeling of Compactor Vibratory Rollers.	Symmetry	2020	DBLP DOI BibTeX RDF
26	Tianyu Xu, Zhijun Zhou, Ruipeng Yan, Zhipeng Zhang, Linxuan Zhu, Chaoran Chen, Fu Xu, Tong Liu	Real-Time Monitoring Method for Layered Compaction Quality of Loess Subgrade Based on Hydraulic Compactor Reinforcement.	Sensors	2020	DBLP DOI BibTeX RDF
26	Jakub Janicki, Grzegorz Mrugalski, Artur Stelmach, Szczepan Urban	Scan Chain Diagnosis-Driven Test Response Compactor.	ATS	2020	DBLP DOI BibTeX RDF
26	Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak	X-Tolerant Tunable Compactor for In-System Test.	ITC	2020	DBLP DOI BibTeX RDF
26	Jayesh Popat, Usha Mehta	Statistical security analysis of AES with X-tolerant response compactor against all types of test infrastructure attacks with/without novel unified countermeasure.	IET Circuits Devices Syst.	2019	DBLP DOI BibTeX RDF
26	Mohammad Urf Maaz, Alexander Sprenger, Sybille Hellebrand	A Hybrid Space Compactor for Adaptive X-Handling.	ITC	2019	DBLP DOI BibTeX RDF
26	Seongmin Hong, Inho Lee, Yongjun Park 0001	NN compactor: Minimizing memory and logic resources for small neural networks.	DATE	2018	DBLP DOI BibTeX RDF
26	M. Sajjia, Saeed Shirazian, David Egan, Javed Iqbal 0006, Ahmad B. Albadarin, Mark Southern, Gavin Walker	Mechanistic modelling of industrial-scale roller compactor 'Freund TF-MINI model'.	Comput. Chem. Eng.	2017	DBLP DOI BibTeX RDF
26	Vishwanath Venkatesan, Mohamad Chaarawi, Quincey Koziol, Edgar Gabriel	Compactor: Optimization Framework at Staging I/O Nodes.	IPDPS Workshops	2014	DBLP DOI BibTeX RDF
26	Yongxia Liu, Aijiao Cui	An Efficient Zero-Aliasing Space Compactor Based on Elementary Gates Combined with XOR Gates.	CAD/Graphics	2013	DBLP DOI BibTeX RDF
26	Baris Ege, Amitabh Das, Santosh Ghosh, Ingrid Verbauwhede	Differential Scan Attack on AES with X-tolerant and X-masked Test Response Compactor.	DSD	2012	DBLP DOI BibTeX RDF
26	Samah Mohamed Saeed, Ozgur Sinanoglu	XOR-Based Response Compactor Adaptive to X-Density Variation.	Asian Test Symposium	2010	DBLP DOI BibTeX RDF
26	Satyendra Biswas, Sunil R. Das, Emil M. Petriu	Space compactor design in VLSI circuits based on graph theoretic concepts.	IEEE Trans. Instrum. Meas.	2006	DBLP DOI BibTeX RDF
26	Tomasz Garbolino, Michal Kopec, Krzysztof Gucwa, Andrzej Hlawiczka	Detection, Localisation and Identification of Interconnection Faults Using MISR Compactor.	DDECS	2006	DBLP DOI BibTeX RDF
26	Sverre Wichlund, Einar J. Aas	Reducing Scan Test Data Volume and Time: A Diagnosis Friendly Finite Memory Compactor.	ATS	2006	DBLP DOI BibTeX RDF
26	Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee 0001, Mark Kassab	X-Press Compactor for 1000x Reduction of Test Data.	ITC	2006	DBLP DOI BibTeX RDF
26	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer	Test response compactor with programmable selector.	DAC	2006	DBLP DOI BibTeX RDF	scan chain selection, unknown states, compression, VLSI test
26	Wu-Tung Cheng, Kun-Han Tsai, Yu Huang 0005, Nagesh Tamarapalli, Janusz Rajski	Compactor Independent Direct Diagnosis.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
26	Andrzej Hlawiczka, Michal Kopec	Dependable testing of compactor MISR: an imperceptible problem?	ETW	2002	DBLP DOI BibTeX RDF
26	Eric Guillo, Maxime Gautier	Dynamic Modeling and Identification of Earthmoving Engines without Kinematic Constraints: Application to the Compactor.	ICRA	2000	DBLP DOI BibTeX RDF
26	Wonjong Kim, Joohack Lee, Hyunchul Shin	A New Hierarchical Layout Compactor Using Simplified Graph Models.	DAC	1992	DBLP BibTeX RDF	ASIC
26	Paul de Dood, John Wawrzynek, Erwin Liu, Roberto Suaya	A Two-Dimensional Topological Compactor With Octagonal Geometry.	DAC	1991	DBLP DOI BibTeX RDF
26	Roshan A. Gidwani, Naveed A. Sherwani	MISER: An Integrated Three Layer Gridless Channel Router and Compactor.	DAC	1990	DBLP DOI BibTeX RDF
26	Dariusz Badura	Efficiency of Self-Test Path as a Test Pattern Generator and Test Response Compactor.	Fehlertolerierende Rechensysteme	1989	DBLP DOI BibTeX RDF
26	Pei-Yung Hsiao, Chen Yung Syau, Wu-Shiung Feng, T. M. Parng, Cheng-Chung Hsu	A rule-based compactor for VLSI/CAD mask layout.	COMPSAC	1988	DBLP DOI BibTeX RDF
26	Paul K. Sun	An octagonal geometry compactor.	ICCD	1988	DBLP DOI BibTeX RDF
26	Christopher Kingsley	A hiererachical, error-tolerant compactor.	DAC	1984	DBLP BibTeX RDF
26	Ralph McGarity, Daniel P. Siewiorek	Experiments with the SLIM Circuit Compactor.	DAC	1983	DBLP BibTeX RDF
26	Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei	X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors.	IEEE Trans. Computers	2008	DBLP DOI BibTeX RDF	output compaction, temporal compactor, blocking unknown values, LFSR reseeding, Built-in Self-Test, BIST, test data compression, MISR, response compaction
26	Edaena Itzel Bautista Ruíz, Laura Elena Hernández Domínguez, Cynthia Fátima Julián Loaeza, José Antonio Velasco Pérez	Ñuu Xaa: a system to support homeless people's self-subsistence.	CHI Extended Abstracts	2008	DBLP DOI BibTeX RDF	aluminum can, compactor, homeless people, recycling, quality of life
26	Nilanjan Mukherjee, Ramesh Karri	Versatile BIST: An Integrated Approach to On-line/Off-line BIST for Data-Dominated Architectures.	J. Electron. Test.	1998	DBLP DOI BibTeX RDF	data-path architectures, response compactor, concurrency, built-in self test, high-level synthesis, on-line test, pattern generator, test function
15	Ozgur Sinanoglu	Scan Architecture With Align-Encode.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
15	Sverre Wichlund, Frank Berntsen, Einar J. Aas	Scan Test Response Compaction Combined with Diagnosis Capabilities.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Scan compression, Diagnosis, ATPG, Yield, Design for test, ATE
15	Melanie Elm, Hans-Joachim Wunderlich	Scan Chain Organization for Embedded Diagnosis.	DATE	2008	DBLP DOI BibTeX RDF
15	Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki	GECOM: Test data compression combined with all unknown response masking.	ASP-DAC	2008	DBLP DOI BibTeX RDF
15	Richard Putman	Using reiterative LFSR based X-masking to increase output compression in presence of unknowns.	ACM Great Lakes Symposium on VLSI	2008	DBLP DOI BibTeX RDF	reiterative, x-masking, compression, LFSR
15	Michal Wegiel, Chandra Krintz	The mapping collector: virtual memory support for generational, parallel, and concurrent compaction.	ASPLOS	2008	DBLP DOI BibTeX RDF	parallel, concurrent, virtual memory, compaction
15	Chunsheng Liu, Yu Huang 0005	Effects of Embedded Decompression and Compaction Architectures on Side-Channel Attack Resistance.	VTS	2007	DBLP DOI BibTeX RDF
15	Omar I. Khan, Michael L. Bushnell	Aliasing Analysis of Spectral Statistical Response Compaction Techniques.	VLSI Design	2006	DBLP DOI BibTeX RDF
15	Christoforos N. Hadjicostis	Aliasing Probability Calculations for Arbitrary Compaction under Independently Selected Random Test Vectors.	IEEE Trans. Computers	2005	DBLP DOI BibTeX RDF	fault activation probabilities, random testing, compaction, Aliasing probability
15	Bjorn De Sutter, Bruno De Bus, Koen De Bosschere	Link-time binary rewriting techniques for program compaction.	ACM Trans. Program. Lang. Syst.	2005	DBLP DOI BibTeX RDF	code abstraction, linker, whole-program optimization, compaction, interprocedural analysis, Program representation, binary rewriting
15	Debdeep Mukhopadhyay, Shibaji Banerjee, Dipanwita Roy Chowdhury, Bhargab B. Bhattacharya	CryptoScan: A Secured Scan Chain Architecture.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
15	Naomi Nishimura, Prabhakar Ragde, Dimitrios M. Thilikos	Parameterized Counting Algorithms for General Graph Covering Problems.	WADS	2005	DBLP DOI BibTeX RDF
15	Vitalij Ocheretnij, G. Kouznetsov, Ramesh Karri, Michael Gössel	On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations.	IOLTS	2005	DBLP DOI BibTeX RDF
15	Per Bjesse, Arne Borälv	DAG-aware circuit compression for formal verification.	ICCAD	2004	DBLP DOI BibTeX RDF
15	Gang Zeng, Hideo Ito	Non-Intrusive Test Compression for SOC Using Embedded FPGA Core.	DFT	2004	DBLP DOI BibTeX RDF
15	Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai	VirtualScan: A New Compressed Scan Technology for Test Cost Reduction.	ITC	2004	DBLP DOI BibTeX RDF
15	Cecilia Metra, T. M. Mak, Martin Omaña 0001	Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing.	ITC	2004	DBLP DOI BibTeX RDF
15	Chen Wang 0014, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Jerzy Tyszer	On Compacting Test Response Data Containing Unknown Values.	ICCAD	2003	DBLP DOI BibTeX RDF
15	Dimitris G. Nikolos, Dimitris Nikolos, Haridimos T. Vergos, Costas Efstathiou	Efficient BIST schemes for RNS datapaths.	ISCAS (5)	2003	DBLP DOI BibTeX RDF
15	Dimitris G. Nikolos, Dimitris Nikolos, Haridimos T. Vergos, Costas Efstathiou	An Efficient BIST scheme for High-Speed Adders.	IOLTS	2003	DBLP DOI BibTeX RDF
15	Peter Wohl, Leendert M. Huisman	Analysis and Design of Optimal Combinational Compactors.	VTS	2003	DBLP DOI BibTeX RDF
15	Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty	Synthesis of single-output space compactors with application to scan-based IP cores.	ASP-DAC	2001	DBLP DOI BibTeX RDF
15	Ondrej Novák, Jiri Nosek	Test-per-Clock Testing of the Circuits with Scan.	IOLTW	2001	DBLP DOI BibTeX RDF