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Publication years (Num. hits)
1996 (1) 2010 (1)
Publication types (Num. hits)
inproceedings(2)
Venues (Conferences, Journals, ...)
AMC(1) VTS(1)
Authors
Alfonso García-Cerezo(1) Anthony Mandow(1) Edward J. McCluskey(1) Jesús Morales(1) Jorge L. Martínez(1) Nur A. Touba(1)
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Found 2 publication records. Showing 2 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
114Nur A. Touba, Edward J. McCluskey Applying two-pattern tests using scan-mapping. Search on Bibsonomy VTS The full citation details ... 1996 DBLP  DOI  BibTeX  RDF scan-mapping, combinational mapping logic, logic testing, built-in self test, built-in self-testing, fault coverage, delay faults, pseudo-random testing, deterministic testing, two-pattern tests
15Jorge L. Martínez, Jesús Morales, Anthony Mandow, Alfonso García-Cerezo Incremental closed-form solution to globally consistent 2D range scan mapping with two-step pose estimation. Search on Bibsonomy AMC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
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